In this paper, we present and discuss the energy distributions and characteristic trajectories of scattered Ar+ ions from the CdSe(001) <110> surface at the angles of incidence ψ =3°, 5°, 7° and at the initial energy E0=3 and 5 keV. In the obtained energy spectra, two intense peaks are observed, which are attributed to ions scattered from the surface atomic layer and the bottom of the semichannel. The trajectories of these ions are also calculated. It is shown that as the angle of incidence increases, the parallelism of the scattered ion trajectory changes and has a zigzag shape. Studying the trajectory of scattered ions makes it possible to determine the depth of ion penetration into the interior of the crystal.