SIMULATION OF THE EFFECT OF A SINGLE INTERFACE TRAPPED CHARGE IN FINFET WITH A GATE LENGTH OF 10 NM ON THE SHORT CHANNEL EFFECTS
In the article, the effect of a single charge on the surface of the oxidesemiconductor boundary of a vertical field-effect transistor with an isolated gate length of 10 nm is studied by modeling the effects of SS and DIBL. In this case, the change in SS and DIBL depending on the position Lgx of the...

Actual problems of Mathematics, Physics and Mecanics / 2020 / December

Abdikarimov Azamat Egamberganovich, Nilufar Matyusupova Bakhtiyorovna

Volume 4 | Issue 6

3 December 2020, 23:18